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Real-Time Defect Detection, Precision Yield Improvement. Hermes Testing Solutions Inc. (HTSI) provides reliable semiconductor testing solutions, and assists its clients to find wafer defects in .With excellent product development and technical capabilities, we create highly .Hermes Testing Solutions Japan Inc. Kumamoto. 9F-2, No.18, Puding Rd., .
Driven by innovative applications such as 5G, AI, and HPC, HTSI offers highly . The need for localization quality at an increasing scale inspired us to build and launch HERMES, the first online subtitling and translation test and indexing system by a major content creator.
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With excellent product development and technical capabilities, we create highly customized testing solutions. From wafer testing to 2D and 3D defect inspection, HTSI is dedicated to .Hermes Testing Solutions Inc. has grown together with semiconductor testing industry for decades. We provide thorough services and technical supports, including Probe Card/Load .
HERMES was to be the first online subtitling and translation test and indexing system established by a major content creator. The test was broken into 5 phases and .Hermes offers support for multi-faceted tests that allow developers to verify an application's behaviour with respect to its function, aesthetics, and operating environment. In addition, .Hermes Teating Solution Inc. has grown together with semiconductor testing industry for decades. We provide thorough services and technical supports, including Probe Card/ Load board .
Find company research, competitor information, contact details & financial data for HERMES TESTING SOLUTIONS INC. of Hsinchu City, Hsinchu. Get the latest business insights from . The Hermes Test is an essential part of software development, and it is essential for ensuring that the software works accurately and efficiently. In this article, we will discuss the . We discuss general questions of cloud testing and examine a set of existing cloud services and testing-as-a-service resources facilitating testing of mobile applications and .Real-Time Defect Detection, Precision Yield Improvement. Hermes Testing Solutions Inc. (HTSI) provides reliable semiconductor testing solutions, and assists its clients to find wafer defects in real time and improve yields.
即時發現缺陷 精準提高良率. 為因應日益複雜的封裝技術發展和晶片的測試需求，從封裝前晶圓測試，到製程中的缺陷檢測服務，漢民測試系統致力於確保客戶產品的品質，提供完整的客製化服務。. 30072 新竹市東區埔頂路18號9樓之2. Tel : 886-3-5835688. Fax : 886-3 .
穩定、可靠、高效探針卡革命性創新. 因應更高頻、高功率的晶圓需求，漢測提供各種針型、針種的晶圓探針卡，可應用於各式終端產品，包含HPC、5G、AIoT、電動車等高頻領域。. 我們專注於技術創新和品質保證，通過獨特的針型設計及製程手法，擁有散熱優異及 .Hermes Testing Solutions (Suzhou) Co., Ltd. was established. Hprobe tester was launched into the market. Awarded the 2017 Hsinchu District “Outstanding General Manager Award”.From wafer testing to 2D and 3D defect inspection, HTSI is dedicated to ensuring the quality of our customers’ products. We have established localized manufacturing lines and responsive after-sales services in multiple locations in Taiwan and Japan to .Hermes Testing Solutions Japan Inc. Kumamoto. 9F-2, No.18, Puding Rd., East Dist., Hsinchu City 30072, Taiwan. Tel : 886-3-5835688.
Driven by innovative applications such as 5G, AI, and HPC, HTSI offers highly customized probe cards and testing services to meet the demand for higher current, smaller pitch, higher frequency, and higher speed testing.100% Taiwan made and with fast repair service. Meet the testing needs of high-frequency RF, with low loss and high fidelity. Applicable to testing GSG probe (including tip) configurations exceeding 67GHz. Exclusive tip design not only stabilizes test performance, but also.9F-2, No.18, Puding Rd., East Dist., Hsinchu City 30072, Taiwan. Tel : 886-3-5835688 Fax : 886-3-5799843
LCD Driver device. Fine-pitch, Au bump, and high-temperature resistant are the most common requirements for LCD driver IC testing. HTSI provides probe cards with durable probe material and support customers to successfully complete the test.Real-Time Defect Detection, Precision Yield Improvement. Hermes Testing Solutions Inc. (HTSI) provides reliable semiconductor testing solutions, and assists its clients to find wafer defects in real time and improve yields.
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即時發現缺陷 精準提高良率. 為因應日益複雜的封裝技術發展和晶片的測試需求，從封裝前晶圓測試，到製程中的缺陷檢測服務，漢民測試系統致力於確保客戶產品的品質，提供完整的客製化服務。. 30072 新竹市東區埔頂路18號9樓之2. Tel : 886-3-5835688. Fax : 886-3 .
穩定、可靠、高效探針卡革命性創新. 因應更高頻、高功率的晶圓需求，漢測提供各種針型、針種的晶圓探針卡，可應用於各式終端產品，包含HPC、5G、AIoT、電動車等高頻領域。. 我們專注於技術創新和品質保證，通過獨特的針型設計及製程手法，擁有散熱優異及 .Hermes Testing Solutions (Suzhou) Co., Ltd. was established. Hprobe tester was launched into the market. Awarded the 2017 Hsinchu District “Outstanding General Manager Award”.From wafer testing to 2D and 3D defect inspection, HTSI is dedicated to ensuring the quality of our customers’ products. We have established localized manufacturing lines and responsive after-sales services in multiple locations in Taiwan and Japan to .Hermes Testing Solutions Japan Inc. Kumamoto. 9F-2, No.18, Puding Rd., East Dist., Hsinchu City 30072, Taiwan. Tel : 886-3-5835688.
Driven by innovative applications such as 5G, AI, and HPC, HTSI offers highly customized probe cards and testing services to meet the demand for higher current, smaller pitch, higher frequency, and higher speed testing.100% Taiwan made and with fast repair service. Meet the testing needs of high-frequency RF, with low loss and high fidelity. Applicable to testing GSG probe (including tip) configurations exceeding 67GHz. Exclusive tip design not only stabilizes test performance, but also.
9F-2, No.18, Puding Rd., East Dist., Hsinchu City 30072, Taiwan. Tel : 886-3-5835688 Fax : 886-3-5799843
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